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Characterization of the Microstructure of an AlN-Mullite-Al2O3Ceramic Layer on WCu Composite Alloy for Microelectronic Application

Characterization of the Microstructure of an AlN-Mullite-Al2O3Ceramic Layer on WCu Composite Alloy for Microelectronic Application

Zhu, Jiandong; An, Rong; Wang, Chunqing; Zhang, Wei; Wen, Guangwu
  • 期刊名称Journal of Electronic Materials
  • 作者Zhu, Jiandong; An, Rong; Wang, Chunqing; Zhang, Wei; Wen, Guangwu
  • 卷第44卷
  • 期第11期
  • 印刷ISSN0361-5235
  • 电子ISSN1543-186X
  • 文件大小2677.44KB
  • 发表时间2015-11
  • DOI10.1007/s11664-015-3961-8
  • 页码4154-4160
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