Light-induced Degradation and Regeneration in n-type Silicon
Niewelt, Tim; Broisch, Juliane; Schön, Jonas; Haunschild, Jonas; Rein, Stefan; Warta, Wilhelm; Schubert, Martin C.
- 期刊名称Energy Procedia
- 作者Niewelt, Tim; Broisch, Juliane; Schön, Jonas; Haunschild, Jonas; Rein, Stefan; Warta, Wilhelm; Schubert, Martin C.
- 卷第77卷
- 印刷ISSN1876-6102
- 文件大小905.24KB
- 发表时间2015-08
- DOI10.1016/j.egypro.2015.07.090
- 页码626-632