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Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier

Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier

Kim, Jooseung; Kim, Dongsu; Cho, Yunsung; Kang, Daehyun; Park, Byungjoon; Moon, Kyunghoon; Kim, Bumman
  • 期刊名称IEEE Transactions on Microwave Theory and Techniques
  • 作者Kim, Jooseung; Kim, Dongsu; Cho, Yunsung; Kang, Daehyun; Park, Byungjoon; Moon, Kyunghoon; Kim, Bumman
  • 卷第63卷
  • 期第12期
  • 印刷ISSN0018-9480
  • 电子ISSN1557-9670
  • 文件大小3289.50KB
  • 发表时间2015-12
  • DOI10.1109/TMTT.2015.2495178
  • 页码4072-4082
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