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Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs

Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs

Ahmed, Fahad; Milor, Linda
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Ahmed, Fahad; Milor, Linda
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小3572.01KB
  • 发表时间2015
  • DOI10.1109/TVLSI.2015.2500900
  • 页码1-11
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