[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Measurement of de-assertion threshold of power-on-reset circuits
- 作者Wadhwa, Sanjay Kumar; Tripathi, Avinash Chandra
- 文件大小382.82KB
- 发表时间2015
- DOI10.1109/ISVDAT.2015.7208109
- 页码1-4
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