Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests
- 期刊名称Journal of Electronic Testing
- 作者Sindia, Suraj; Agrawal, Vishwani D.
- 卷第31卷
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小730.08KB
- 发表时间2015-12
- DOI10.1007/s10836-015-5545-1
- 页码479-489
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