SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Advances in Optical Thin Films V - Advanced optical monitoring system using a new developed low noise wideband spectrometer system
- 作者Lequime, Michel; Macleod, H. Angus; Ristau, Detlev; Zöller, Alfons; Arhilger, Detlef; Boos, Michael; Hagedorn, Harro
- 卷第9627卷
- 印刷ISSN0277-786X
- 文件大小748.67KB
- 发表时间2015
- DOI10.1117/12.2191269
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