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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Design of the new rigid endoscope distortion measurement system

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Design of the new rigid endoscope distortion measurement system

Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Zhai, Xiaohao; Liu, Xiaohua; Liu, Ming; Hui, Mei; Dong, Liquan; Zhao, Yuejin; Wang, Yakun; Li, Yonghui; Zhou, Peng
  • 作者Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Zhai, Xiaohao; Liu, Xiaohua; Liu, Ming; Hui, Mei; Dong, Liquan; Zhao, Yuejin; Wang, Yakun; Li, Yonghui; Zhou, Peng
  • 卷第9623卷
  • 印刷ISSN0277-786X
  • 文件大小1003.62KB
  • 发表时间2015
  • DOI10.1117/12.2193142
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