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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology - The influence of thermal treatment on the passivation of SiN <sub/>x</sub> film and the dark current of p-i-n InGaAs detector

SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology - The influence of thermal treatment on the passivation of SiN x film and the dark current of p-i-n InGaAs detector

Gong, Haimei; Wu, Nanjian; Ni, Yang; Chen, Weibiao; Lu, Jin; Cao, Gaoqi; Tang, Hengjing; Shao, Xiumei; Wang, Rui; Li, Qingfa; Cheng, Jifeng; Li, Tao; Li, Xue; Gong, Haimei
  • 作者Gong, Haimei; Wu, Nanjian; Ni, Yang; Chen, Weibiao; Lu, Jin; Cao, Gaoqi; Tang, Hengjing; Shao, Xiumei; Wang, Rui; Li, Qingfa; Cheng, Jifeng; Li, Tao; Li, Xue; Gong, Haimei
  • 卷第9674卷
  • 印刷ISSN0277-786X
  • 文件大小758.98KB
  • 发表时间2015
  • DOI10.1117/12.2199226
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