[IEEE 2015 IEEE International Conference on Data Mining (ICDM) - Atlantic City, NJ, USA (2015.11.14-2015.11.17)] 2015 IEEE International Conference on Data Mining - Forensic Style Analysis with Survival Trajectories
Yadav, Pranjul; Steinbach, Michael; Pruinelli, Lisiane; Westra, Bonnie; Delaney, Connie; Kumar, Vipin; Simon, Gyorgy
- 作者Yadav, Pranjul; Steinbach, Michael; Pruinelli, Lisiane; Westra, Bonnie; Delaney, Connie; Kumar, Vipin; Simon, Gyorgy
- 文件大小198.03KB
- 发表时间2015
- DOI10.1109/icdm.2015.152
- 页码1069-1074