![SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Methods for Arts and Archaeology - NRC's 3D technology for museum and heritage applications]()
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Methods for Arts and Archaeology - NRC's 3D technology for museum and heritage applicationsTaylor, J.; Salimbeni, Renzo; Pezzati, Luca; Blais, F.; Beraldin, J.-A.; Godin, G.; Borgeat, L.; El-Hakim, S. F.; Paquet, E.; Cournoyer, L.; Picard, M.; Rioux, M.; Lahanier, C.; Aitken, G. · 2005