SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Phase extraction based on sinusoidal extreme strip phase shifting method
- 作者Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Hui, Mei; Liu, Ming; Dong, Liquan; Liu, Xiaohua; Zhao, Yuejin
- 卷第9623卷
- 印刷ISSN0277-786X
- 文件大小620.93KB
- 发表时间2015
- DOI10.1117/12.2192640
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