[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

• 作者Clemente, Juan Antonio; Franco, Francisco J.; Villa, Francesca; Baylac, Maud; Rey, Solenne; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
• 文件大小337.15KB
• 发表时间2015
• DOI10.1109/radecs.2015.7365670
• 页码1-4