[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Fully functional perpendicular STT-MRAM macro embedded in 40 nm logic for energy-efficient IOT applications

• 作者Lu, Yu; Zhong, Tom; Hsu, W.; Kim, S.; Lu, X.; Kan, J. J.; Park, C.; Chen, W. C.; Li, X.; Zhu, X.; Wang, P.; Gottwald, M.; Fatehi, J.; Seward, L.; Kim, J. P.; Yu, N.; Jan, G.; Haq, J.; Le, S.; Wang, Y. J.; Thomas, L.; Zhu, J.; Liu, H.; Lee, Y. J.; Tong, R. Y.; Pi, K.; Shen, D.; He, R.; Teng, Z.; Lam, V.; Annapragada, R.; Torng, T.; Wang, Po-Kang; Kang, S. H.
• 文件大小686.03KB
• 发表时间2015
• DOI10.1109/IEDM.2015.7409770