![SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Ultra-precision optical metrology using highly controlled fiber-based frequency combs]()
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Ultra-precision optical metrology using highly controlled fiber-based frequency combsLehmann, Peter; Osten, Wolfgang; Albertazzi Gonçalves, Armando; Minoshima, Kaoru; Nakajima, Yoshiaki; Wu, Guanhao · 2015