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Characterization of Electron-Induced Defects in Cu (In, Ga) Se2 Thin Films by Photoluminescence

Kawakita, Shirou; Imaizumi, Mitsuru; Ishizuka, Shogo; Shibata, Hajime; Niki, Shigeru; Okuda, Shuichi; Kusawake, Hiroaki

期刊名称MRS Proceedings
作者Kawakita, Shirou; Imaizumi, Mitsuru; Ishizuka, Shogo; Shibata, Hajime; Niki, Shigeru; Okuda, Shuichi; Kusawake, Hiroaki
卷第1771卷
电子ISSN1946-4274
文件大小202.23KB
发表时间2015
DOI10.1557/opl.2015.405
页码157-161