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[IEEE 2015 27th International Conference on Microelectronics (ICM) - Casablanca, Morocco (2015.12.20-2015.12.23)] 2015 27th International Conference on Microelectronics (ICM) - Image quality assessment using nonlinear learning methods

[IEEE 2015 27th International Conference on Microelectronics (ICM) - Casablanca, Morocco (2015.12.20-2015.12.23)] 2015 27th International Conference on Microelectronics (ICM) - Image quality assessment using nonlinear learning methods

Alhakim, Rshdee; Tchendjou, Ghislain Takam; Simeu, Emmanuel; Lebowsky, Fritz

作者Alhakim, Rshdee; Tchendjou, Ghislain Takam; Simeu, Emmanuel; Lebowsky, Fritz
文件大小964.83KB
发表时间2015
DOI10.1109/icm.2015.7437973
页码5-8

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