[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - An impressive approach for incorporating parallelism in designing DMFB with cross contamination avoidance

• 作者Dhal, Debasis; Datta, Piyali; Chakrabarty, Arpan; Roy, Sudipta; Pal, Rajat Kumar
• 文件大小234.36KB
• 发表时间2015
• DOI10.1109/isvdat.2015.7208137
• 页码1-6