Probing Electronic Structures of Organic Semiconductors at Buried Interfaces by Electronic Sum Frequency Generation Spectroscopy
- 期刊名称The Journal of Physical Chemistry C
- 作者Li, Yingmin; Wang, Jiaxi; Xiong, Wei
- 卷第119卷
- 期第50期
- 印刷ISSN1932-7447
- 电子ISSN1932-7455
- 文件大小1202.76KB
- 发表时间2015-12-17
- DOI10.1021/acs.jpcc.5b10725
- 页码28083-28089
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