Electrical Characterization and Defect-Related Luminescence in Oxygen Implanted Silicon
Danilov, D.V.; Vyvenko, O.F.; Sobolev, N.A.; Vdovin, V.I.; Loshachenko, A.S.; Shek, E.I.; Aruev, P.N.; Zabrodskiy, V.V.
- 期刊名称Solid State Phenomena
- 作者Danilov, D.V.; Vyvenko, O.F.; Sobolev, N.A.; Vdovin, V.I.; Loshachenko, A.S.; Shek, E.I.; Aruev, P.N.; Zabrodskiy, V.V.
- 卷第242卷
- 电子ISSN1662-9779
- 文件大小1043.64KB
- 发表时间2015-10
- DOI10.4028/www.scientific.net/ssp.242.368
- 页码368-373