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[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Design and testing of CMOS compatible EEPROM

[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Design and testing of CMOS compatible EEPROM

Yin, Haibin; Peng, Xiaohong; Wan, Peiyuan; Wang, Jinhui; Hou, Ligang

作者Yin, Haibin; Peng, Xiaohong; Wan, Peiyuan; Wang, Jinhui; Hou, Ligang
文件大小302.15KB
发表时间2015
DOI10.1109/ASICON.2015.7517140
页码1-4

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