Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test
- 期刊名称IEICE Electronics Express
- 作者Wu, Minshun; Liu, Zhiqiang; Chen, Degang
- 卷第12卷
- 期第20期
- 电子ISSN1349-2543
- 文件大小1117.00KB
- 发表时间2015
- DOI10.1587/elex.12.20150742
- 页码20150742-20150742
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