Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy

Bowman, W. J.; Darbal, A.; Kelly, M.; Rohrer, G.S.; Hernandez, C.H.; McGuinness, K.; Crozier, P.A.

期刊名称Microscopy and Microanalysis
作者Bowman, W. J.; Darbal, A.; Kelly, M.; Rohrer, G.S.; Hernandez, C.H.; McGuinness, K.; Crozier, P.A.
卷第21卷
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小283.04KB
发表时间2015-08
DOI10.1017/S1431927615003256
页码491-492

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