2D Electric field imagery in 4H-SiC power diodes using OBIC technique
Hamad, Hassan; Bevilacqua, Pascal; Planson, Dominique; Raynaud, Christophe; Tournier, Dominique; Vergne, Bertrand; Lazar, Mihai; Brosselard, Pierre; Razek, Adel
- 期刊名称The European Physical Journal Applied Physics
- 作者Hamad, Hassan; Bevilacqua, Pascal; Planson, Dominique; Raynaud, Christophe; Tournier, Dominique; Vergne, Bertrand; Lazar, Mihai; Brosselard, Pierre; Razek, Adel
- 卷第72卷
- 期第2期
- 印刷ISSN1286-0042
- 电子ISSN1286-0050
- 文件大小943.30KB
- 发表时间2015-11
- DOI10.1051/epjap/2015150054