[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Finite aperture time effects in sampling circuit
Arai, Miho; Shimizu, Isao; Kobayashi, Haruo; Kurihara, Keita; Sasaki, Shu; Shibuya, Shohei; Niitsu, Kiichi; Kubo, Kazuyoshi
- 作者Arai, Miho; Shimizu, Isao; Kobayashi, Haruo; Kurihara, Keita; Sasaki, Shu; Shibuya, Shohei; Niitsu, Kiichi; Kubo, Kazuyoshi
- 文件大小359.12KB
- 发表时间2015
- DOI10.1109/asicon.2015.7516913
- 页码1-4