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Electronic structure and insulating gap in epitaxial VO
              <sub/>2</sub>
              polymorphs

Electronic structure and insulating gap in epitaxial VO 2 polymorphs

Lee, Shinbuhm; Meyer, Tricia L.; Sohn, Changhee; Lee, Donghwa; Nichols, John; Lee, Dongkyu; Seo, Sung S. Ambrose; Freeland, John W.; Noh, Tae Won; Lee, Ho Nyung
  • 期刊名称APL Materials
  • 作者Lee, Shinbuhm; Meyer, Tricia L.; Sohn, Changhee; Lee, Donghwa; Nichols, John; Lee, Dongkyu; Seo, Sung S. Ambrose; Freeland, John W.; Noh, Tae Won; Lee, Ho Nyung
  • 卷第3卷
  • 期第12期
  • 电子ISSN2166-532X
  • 文件大小1191.53KB
  • 发表时间2015-12
  • DOI10.1063/1.4939004
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