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Tomographic measurement of buried interface roughness

Tomographic measurement of buried interface roughness

Hayashida, Misa; Ogawa, Shinichi; Malac, Marek
  • 期刊名称Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
  • 作者Hayashida, Misa; Ogawa, Shinichi; Malac, Marek
  • 卷第33卷
  • 期第4期
  • 印刷ISSN2166-2746
  • 电子ISSN2166-2754
  • 文件大小769.07KB
  • 发表时间2015-07
  • DOI10.1116/1.4926975
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