Analysis of kink phenomenon in S 11-parameter of standard RF MOSFETs
- 期刊名称Electronics Letters
- 作者Ahn, Jahyun; Lee, Seonghearn
- 卷第51卷
- 期第18期
- 印刷ISSN0013-5194
- 电子ISSN1350-911X
- 文件大小334.35KB
- 发表时间2015-09-03
- DOI10.1049/el.2015.1270
- 页码1453-1455
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