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Direct TEM/STEM Observation and Analysis of Bismuth Segregation to Grain Boundary Dislocation Cores in Bismuth Embrittled Copper Bicrystals

Direct TEM/STEM Observation and Analysis of Bismuth Segregation to Grain Boundary Dislocation Cores in Bismuth Embrittled Copper Bicrystals

Wade, C. A.; Watanabe, M.
  • 期刊名称Microscopy and Microanalysis
  • 作者Wade, C. A.; Watanabe, M.
  • 卷第21卷
  • 印刷ISSN1431-9276
  • 电子ISSN1435-8115
  • 文件大小475.94KB
  • 发表时间2015-08
  • DOI10.1017/S1431927615009496
  • 页码1743-1744
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