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Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO
              <sub/>2</sub>
              matrix studied by atom probe tomography

Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO 2 matrix studied by atom probe tomography

Han, Bin; Shimizu, Yasuo; Seguini, Gabriele; Arduca, Elisa; Castro, Celia; Ben Assayag, Gérard; Inoue, Koji; Nagai, Yasuyoshi; Schamm-Chardon, Sylvie; Perego, Michele
  • 期刊名称RSC Adv.
  • 作者Han, Bin; Shimizu, Yasuo; Seguini, Gabriele; Arduca, Elisa; Castro, Celia; Ben Assayag, Gérard; Inoue, Koji; Nagai, Yasuyoshi; Schamm-Chardon, Sylvie; Perego, Michele
  • 卷第6卷
  • 期第5期
  • 电子ISSN2046-2069
  • 文件大小1765.50KB
  • 发表时间2016
  • DOI10.1039/C5RA26710B
  • 页码3617-3622
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