Using ToF-SIMS to study industrial surface phenomena
Smentkowski, Vincent S.; Keenan, Michael R.; Arlinghaus, Henrik
- 期刊名称Surface Science
- 作者Smentkowski, Vincent S.; Keenan, Michael R.; Arlinghaus, Henrik
- 印刷ISSN0039-6028
- 文件大小2220.86KB
- 发表时间2016-3
- DOI10.1016/j.susc.2016.02.017