Test Reliability at the Individual Level

Hu, Yueqin; Nesselroade, John R.; Erbacher, Monica K.; Boker, Steven M.; Burt, S. Alexandra; Keel, Pamela K.; Neale, Michael C.; Sisk, Cheryl L.; Klump, Kelly

期刊名称Structural Equation Modeling: A Multidisciplinary Journal
作者Hu, Yueqin; Nesselroade, John R.; Erbacher, Monica K.; Boker, Steven M.; Burt, S. Alexandra; Keel, Pamela K.; Neale, Michael C.; Sisk, Cheryl L.; Klump, Kelly
印刷ISSN1070-5511
电子ISSN1532-8007
文件大小489.21KB
发表时间2016-04-07
DOI10.1080/10705511.2016.1148605
页码1-12

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Test Reliability at the Individual Level