![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - An improved full automated endmember extraction algorithm based on endmember independence]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - An improved full automated endmember extraction algorithm based on endmember independencePagano, Thomas S.; Silny, John F.; Wang, Yiran; Zhong, Shengwei; Zhang, Ye · 2015