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Effects of top-layer thickness on electrical performance and stability in VZTO/ZTO bi-layer thin-film transistors

Yun, Myeong Gu; Ahn, Cheol Hyoun; Kim, Ye Kyun; Cho, Sung Woon; Cho, Hyung Koun; Kim, Hyoungsub

期刊名称Journal of Alloys and Compounds
作者Yun, Myeong Gu; Ahn, Cheol Hyoun; Kim, Ye Kyun; Cho, Sung Woon; Cho, Hyung Koun; Kim, Hyoungsub
卷第672卷
印刷ISSN0925-8388
文件大小2287.96KB
发表时间2016-07
DOI10.1016/j.jallcom.2016.02.166
页码449-456