SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Sunday 17 April 2016)] Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII - NEFDS contamination model parameter estimation of powder contaminated surfaces
Velez-Reyes, Miguel; Messinger, David W.; Gibbs, Timothy J.; Messinger, David W.
- 作者Velez-Reyes, Miguel; Messinger, David W.; Gibbs, Timothy J.; Messinger, David W.
- 卷第9840卷
- 印刷ISSN0277-786X
- 文件大小5045.09KB
- 发表时间2016
- DOI10.1117/12.2222302