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Rapid Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry

Rapid Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry

Yersak, Alexander S.; Lewis, Ryan J.; Tran, Jenny; Lee, Yung-Cheng

期刊名称ACS Applied Materials & Interfaces
作者Yersak, Alexander S.; Lewis, Ryan J.; Tran, Jenny; Lee, Yung-Cheng
印刷ISSN1944-8244
电子ISSN1944-8252
文件大小9960.62KB
发表时间2016-06-16
DOI10.1021/acsami.6b03606

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