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Reliability Analysis of Masked Data in Adaptive Step-Stress Partially Accelerated Lifetime Tests with Progressive Removal

Reliability Analysis of Masked Data in Adaptive Step-Stress Partially Accelerated Lifetime Tests with Progressive Removal

Liu, Bin; Shi, Yimin; Cai, Jing; Wang, Ruibing
  • 期刊名称Communications in Statistics - Theory and Methods
  • 作者Liu, Bin; Shi, Yimin; Cai, Jing; Wang, Ruibing
  • 印刷ISSN0361-0926
  • 电子ISSN1532-415X
  • 文件大小727.63KB
  • 发表时间2016-06-17
  • DOI10.1080/03610926.2015.1122058
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