Analytic Estimation of Thermal Resistance in HBTs
Chakravorty, Anjan; D'Esposito, Rosario; Balanethiram, Suresh; Fregonese, Sebastien; Zimmer, Thomas
- 期刊名称IEEE Transactions on Electron Devices
- 作者Chakravorty, Anjan; D'Esposito, Rosario; Balanethiram, Suresh; Fregonese, Sebastien; Zimmer, Thomas
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1474.25KB
- 发表时间2016
- DOI10.1109/ted.2016.2572959
- 页码1-5