Reliability Tradeoffs in Design of Volatile and Nonvolatile Caches
- 期刊名称Journal of Circuits, Systems and Computers
- 作者Mittal, Sparsh; Vetter, Jeffrey S.
- 印刷ISSN0218-1266
- 电子ISSN1793-6454
- 文件大小209.81KB
- 发表时间2016-06-27
- DOI10.1142/S0218126616501395
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