An Empirical Comparison of Model Validation Techniques for Defect Prediction Models

• 期刊名称IEEE Transactions on Software Engineering
• 作者Tantithamthavorn, Chakkrit; McIntosh, Shane; Hassan, Ahmed; Matsumoto, Kenichi
• 印刷ISSN0098-5589
• 电子ISSN1939-3520
• 文件大小1846.78KB
• 发表时间2016
• DOI10.1109/tse.2016.2584050
• 页码1-1