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Semi-structured Interview Measure of Stigma (SIMS) in psychosis: Assessment of psychometric properties

Semi-structured Interview Measure of Stigma (SIMS) in psychosis: Assessment of psychometric properties

Wood, Lisa; Burke, Eilish; Byrne, Rory; Enache, Gabriela; Morrison, Anthony P.
  • 期刊名称Schizophrenia Research
  • 作者Wood, Lisa; Burke, Eilish; Byrne, Rory; Enache, Gabriela; Morrison, Anthony P.
  • 印刷ISSN0920-9964
  • 文件大小368.13KB
  • 发表时间2016-7
  • DOI10.1016/j.schres.2016.06.008
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