[IEEE 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016 - Ottawa, ON, Canada (2016.7.25-2016.7.29)] 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Theoretical analysis of BCI test system using circuit concept approach
Murano, Kimitoshi; Takata, Naoki; Hoshino, Misaki; Kami, Yoshio; Xiao, Fengchao; Tayarani, Majid
- 作者Murano, Kimitoshi; Takata, Naoki; Hoshino, Misaki; Kami, Yoshio; Xiao, Fengchao; Tayarani, Majid
- 文件大小532.82KB
- 发表时间2016
- DOI10.1109/ISEMC.2016.7571716
- 页码600-603