[NanoScience and Technology] Helium Ion Microscopy || Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale
- 作者Hlawacek, Gregor; Gölzhäuser, Armin
- 文件大小1473.26KB
- 发表时间2016
- DOI10.1007/978-3-319-41990-9_12
- 页码265-295
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