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[NanoScience and Technology] Helium Ion Microscopy || Structural Changes in 2D Materials Due to Scattering of Light Ions

[NanoScience and Technology] Helium Ion Microscopy || Structural Changes in 2D Materials Due to Scattering of Light Ions

Hlawacek, Gregor; Gölzhäuser, Armin

作者Hlawacek, Gregor; Gölzhäuser, Armin
文件大小1015.06KB
发表时间2016
DOI10.1007/978-3-319-41990-9_3
页码63-88

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