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[IEEE 2016 IEEE Electrical Insulation Conference (EIC) - Montreal, QC, Canada (2016.6.19-2016.6.22)] 2016 IEEE Electrical Insulation Conference (EIC) - Analysis of turn insulation degradation under voltage surge stress

[IEEE 2016 IEEE Electrical Insulation Conference (EIC) - Montreal, QC, Canada (2016.6.19-2016.6.22)] 2016 IEEE Electrical Insulation Conference (EIC) - Analysis of turn insulation degradation under voltage surge stress

Provencher, H.; Millet, C.; Noel, S.

作者Provencher, H.; Millet, C.; Noel, S.
文件大小645.53KB
发表时间2016
DOI10.1109/EIC.2016.7548625
页码409-413

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