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Implications of Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience

Implications of Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience

Guo, Xinfei; Stan, Mircea R.

期刊名称Integration, the VLSI Journal
作者Guo, Xinfei; Stan, Mircea R.
印刷ISSN0167-9260
文件大小829.40KB
发表时间2016-10
DOI10.1016/j.vlsi.2016.10.008

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