SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices - THz transmittance and electrical properties of silicon doped vanadium dioxide films tuning by annealing temperature
- 作者Jiang, Yadong; Kippelen, Bernard; Yu, Junsheng; Wu, Xuefei; Wu, Zhiming; Ji, Chunhui; Huang, Zehua; Gou, Jun; Wang, Jun; Jiang, Yadong
- 卷第9686卷
- 印刷ISSN0277-786X
- 文件大小1028.87KB
- 发表时间2016
- DOI10.1117/12.2242776
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