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[IEEE 2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC) - Seoul, South Korea (2016.8.21-2016.8.25)] 2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC) - EM noise immunity enhancement using Schmitt Trigger logic gates in CMOS process

[IEEE 2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC) - Seoul, South Korea (2016.8.21-2016.8.25)] 2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC) - EM noise immunity enhancement using Schmitt Trigger logic gates in CMOS process

Park, SangHyeok; Kim, Kyungsoo; Huynh, Hai Au; Joo, Soyeon; Kim, SoYoung

作者Park, SangHyeok; Kim, Kyungsoo; Huynh, Hai Au; Joo, Soyeon; Kim, SoYoung
文件大小1913.62KB
发表时间2016
DOI10.1109/ursiap-rasc.2016.7601322
页码915-918

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