[IEEE 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - London, United Kingdom (2016.10.3-2016.10.4)] 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - Linearity characterization of GaN HEMT technologies through innovative on-wafer multi-tone load-pull measurements
Kahil, Si Abed Karim; Laurent, Sylvain; Quere, Raymond; Sombrin, Jacques; Floriot, Didier; Brunel, Valeria; Teyssandier, Charles
- 作者Kahil, Si Abed Karim; Laurent, Sylvain; Quere, Raymond; Sombrin, Jacques; Floriot, Didier; Brunel, Valeria; Teyssandier, Charles
- 文件大小659.16KB
- 发表时间2016
- DOI10.1109/EuMIC.2016.7777483
- 页码37-40