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[IEEE 2016 IEEE Dallas Circuits and Systems Conference (DCAS) - Arligton, TX, USA (2016.10.10-2016.10.10)] 2016 IEEE Dallas Circuits and Systems Conference (DCAS) - High frequency noise characterization of BiCMOS transistors over temperature

[IEEE 2016 IEEE Dallas Circuits and Systems Conference (DCAS) - Arligton, TX, USA (2016.10.10-2016.10.10)] 2016 IEEE Dallas Circuits and Systems Conference (DCAS) - High frequency noise characterization of BiCMOS transistors over temperature

Cheng, Peng; Shichijo, Hisashi
  • 作者Cheng, Peng; Shichijo, Hisashi
  • 文件大小417.68KB
  • 发表时间2016
  • DOI10.1109/DCAS.2016.7791130
  • 页码1-4
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